Title :
High-current single-junction metal semiconductor rectifiers
Author :
Davies, G. ; Tibol, G.
Author_Institution :
Solitron Devices, Inc., Tappan, NY, USA
Keywords :
Circuit testing; Conductivity; Copper; Fabrication; Frequency; Knee; Rectifiers; Silicon; Substrates; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1967.1154551
