DocumentCode :
2845275
Title :
AC junction thermometer
Author :
Bargen, D.
Author_Institution :
Electro-Optical Systems, Inc., Pasadena, CA, USA
Volume :
X
fYear :
1967
fDate :
15-17 Feb. 1967
Firstpage :
90
Lastpage :
91
Keywords :
Circuits; Current measurement; Difference equations; Differential equations; P-n junctions; Radiative recombination; Semiconductor diodes; Stability; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1967.1154554
Filename :
1154554
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2845275
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