Title :
Microwave resonance detection of high-energy radiation defects in VLSI for space applications
Author :
Kawano, K. ; Lin, Q. ; Ishida, K. ; Hara, Y. ; Nyunt, Khine
Author_Institution :
Dept. of Electron. Eng., Univ. of Electro-Commun., Tokyo, Japan
Abstract :
A method of microwave resonance detection was attempted on radiation defects generated by cosmic rays that caused soft errors in VLSI operation for space application. Under γ-ray irradiation of 106 rad, new signals were observed. The intensities of the observed signals correlate with soft error rates. The origin of new centers, however, remains some ambiguities owing to low signal to noise ratios to determine definite structures
Keywords :
EPR spectroscopy; VLSI; digital integrated circuits; errors; gamma-ray effects; integrated circuit testing; microwave spectroscopy; space vehicle electronics; γ-ray irradiation; 1E6 rad; EPR signal; VLSI operation; cosmic rays; high-energy radiation defects; microwave resonance detection; soft error rates; soft errors; space applications; Electrons; Large scale integration; Magnetic resonance; Paramagnetic resonance; Radiation detectors; Semiconductor device measurement; Substrates; Testing; Very large scale integration; Wet etching;
Conference_Titel :
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4308-5
DOI :
10.1109/ICMMT.1998.768414
