DocumentCode :
2845460
Title :
A simple yet accurate method for characterizing nonreflecting two-port devices
Author :
Wan, Changhua
Author_Institution :
Dept. of Phys., Tromso Univ., Norway
fYear :
1998
fDate :
1998
Firstpage :
853
Lastpage :
856
Abstract :
This paper presents a simple yet accurate method for characterizing a nonreflecting two-port device using a network analyzer. The method is so simple that a through connection of two measurement ports and insertion of the device between the ports are what needs to be measured. Also, it is so accurate that influences of systematic errors on the transmission parameters of the device can be completely removed without using any other calibration standards. A well-known result for a length of nonreflecting and reciprocal transmission line is just one of the applications of the method
Keywords :
S-matrix theory; S-parameters; calibration; measurement errors; microwave measurement; network analysers; S-matrix measurements; measurement ports; network analyzer; nonreflecting transmission line; nonreflecting two-port devices; reciprocal transmission line; transmission parameters; two-port device characterisation; Calibration; Electric variables measurement; Measurement standards; Performance evaluation; Permittivity measurement; Physics; Propagation constant; Scattering parameters; Transmission line matrix methods; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4308-5
Type :
conf
DOI :
10.1109/ICMMT.1998.768423
Filename :
768423
Link To Document :
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