• DocumentCode
    2845460
  • Title

    A simple yet accurate method for characterizing nonreflecting two-port devices

  • Author

    Wan, Changhua

  • Author_Institution
    Dept. of Phys., Tromso Univ., Norway
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    853
  • Lastpage
    856
  • Abstract
    This paper presents a simple yet accurate method for characterizing a nonreflecting two-port device using a network analyzer. The method is so simple that a through connection of two measurement ports and insertion of the device between the ports are what needs to be measured. Also, it is so accurate that influences of systematic errors on the transmission parameters of the device can be completely removed without using any other calibration standards. A well-known result for a length of nonreflecting and reciprocal transmission line is just one of the applications of the method
  • Keywords
    S-matrix theory; S-parameters; calibration; measurement errors; microwave measurement; network analysers; S-matrix measurements; measurement ports; network analyzer; nonreflecting transmission line; nonreflecting two-port devices; reciprocal transmission line; transmission parameters; two-port device characterisation; Calibration; Electric variables measurement; Measurement standards; Performance evaluation; Permittivity measurement; Physics; Propagation constant; Scattering parameters; Transmission line matrix methods; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-4308-5
  • Type

    conf

  • DOI
    10.1109/ICMMT.1998.768423
  • Filename
    768423