DocumentCode :
2845638
Title :
On the Reliability of Large-Scale Distributed Systems A Topological View
Author :
He, Yuan ; Ren, Hao ; Liu, Yunhao ; Yang, Baijian
Author_Institution :
Hong Kong Univ. of Sci. & Technol., Kowloon
fYear :
2008
fDate :
9-12 Sept. 2008
Firstpage :
165
Lastpage :
172
Abstract :
In large-scale, self-organized and distributed systems, such as peer-to-peer (P2P) overlays and wireless sensor networks (WSN), a small proportion of nodes are likely to be more critical to the system´s reliability than the others. This paper focuses on detecting cut vertices so that we can either neutralize or protect these critical nodes. Detection of cut vertices is trivial if the global knowledge of the whole system is known but it is very challenging when the global knowledge is missing. In this paper, we propose a completely distributed scheme where every single node can determine whether it is a cut vertex or not. In addition, our design can also confine the detection overhead to a constant instead of being proportional to the size of a network. The correctness of this algorithm is theoretically proved and a number of performance measures are verified through trace driven simulations.
Keywords :
large-scale systems; peer-to-peer computing; telecommunication network reliability; wireless sensor networks; P2P overlays; detection overhead; distributed scheme; distributed systems; large-scale distributed systems; peer-to-peer; performance measures; self-organized systems; trace driven simulations; wireless sensor networks; Helium; Large-scale systems; Network topology; Parallel processing; Peer to peer computing; Power system protection; Reliability; Sensor systems; Telecommunication traffic; Wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel Processing, 2008. ICPP '08. 37th International Conference on
Conference_Location :
Portland, OR
ISSN :
0190-3918
Print_ISBN :
978-0-7695-3374-2
Electronic_ISBN :
0190-3918
Type :
conf
DOI :
10.1109/ICPP.2008.9
Filename :
4625846
Link To Document :
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