DocumentCode
2846013
Title
Reliability results of HBTs with an InGaP emitter
Author
Whitman, Charles S.
fYear
2005
fDate
Oct. 30, 2005
Firstpage
19
Lastpage
41
Keywords
Acceleration; Degradation; Heterojunction bipolar transistors; Maximum likelihood estimation; Qualifications; Radio frequency; Temperature dependence; Temperature distribution; Temperature measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
Print_ISBN
0-7908-0106-X
Type
conf
DOI
10.1109/ROCS.2005.201551
Filename
1563935
Link To Document