DocumentCode
2846039
Title
Determining factors affecting ESD failure voltage using DOE
Author
Whitman, Charles S. ; Gilbert, Terri M. ; Rahn, Ann M. ; Antonell, Jennifer A.
fYear
2005
fDate
Oct. 30, 2005
Firstpage
57
Lastpage
77
Keywords
Assembly; Circuits; Electrostatic discharge; Failure analysis; Gallium arsenide; Logistics; Protection; Radio frequency; US Department of Energy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
Print_ISBN
0-7908-0106-X
Type
conf
DOI
10.1109/ROCS.2005.201553
Filename
1563937
Link To Document