DocumentCode :
2846039
Title :
Determining factors affecting ESD failure voltage using DOE
Author :
Whitman, Charles S. ; Gilbert, Terri M. ; Rahn, Ann M. ; Antonell, Jennifer A.
fYear :
2005
fDate :
Oct. 30, 2005
Firstpage :
57
Lastpage :
77
Keywords :
Assembly; Circuits; Electrostatic discharge; Failure analysis; Gallium arsenide; Logistics; Protection; Radio frequency; US Department of Energy; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
Print_ISBN :
0-7908-0106-X
Type :
conf
DOI :
10.1109/ROCS.2005.201553
Filename :
1563937
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2846039
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