DocumentCode
2846040
Title
Measurement techniques for evaluating thin-film piezoelectric transducers
Author
Bahr, Alexander ; Reeder, T.
Author_Institution
Stanforth Research Institute, Menlo Park, CA, USA
Volume
XI
fYear
1968
fDate
14-16 Feb. 1968
Firstpage
14
Lastpage
15
Keywords
Coupling circuits; Equations; Equivalent circuits; Frequency; Loss measurement; Measurement techniques; Piezoelectric films; Piezoelectric materials; Piezoelectric transducers; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1968 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1968.1154600
Filename
1154600
Link To Document