Title :
Full band ensemble monte carlo simulations for reliability investigation of highvoltage single & double heterojunction bipolar transistors for military and base station applications including a proposed high breakdown composite collector design
Keywords :
Acoustic scattering; Base stations; Double heterojunction bipolar transistors; Effective mass; Electric breakdown; Electromagnetic compatibility; Electrons; Optical scattering; Phonons; Photonic band gap;
Conference_Titel :
ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
Print_ISBN :
0-7908-0106-X
DOI :
10.1109/ROCS.2005.201559
