DocumentCode :
2846161
Title :
Application of aluminium metallisation in ldmos RF power applications
Author :
van der Wel, P.J. ; van den Heuvel, R.A. ; Peuscher, H.J.F. ; Li, Y. ; Gommans, J.G. ; van Rijs, F. ; Bron, P. ; Theeuwen, S.J.C.H.
fYear :
2005
fDate :
Oct. 30, 2005
Firstpage :
151
Lastpage :
154
Keywords :
Aluminum; Base stations; Degradation; Electromigration; Gold; Metallization; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
Print_ISBN :
0-7908-0106-X
Type :
conf
DOI :
10.1109/ROCS.2005.201561
Filename :
1563945
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2846161