DocumentCode :
2846187
Title :
Reliability testing of an lna with 0.18 μm gate process
Author :
Jen, Hei-Ruey H. ; Ersland, Peter ; Gil, Carlos ; Lung, Shiou ; Chu, Grace
fYear :
2005
fDate :
Oct. 30, 2005
Firstpage :
157
Lastpage :
162
Keywords :
Current measurement; Degradation; Diodes; Electrostatic discharge; Performance evaluation; Phase change materials; Stress; Testing; Vehicles; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
Print_ISBN :
0-7908-0106-X
Type :
conf
DOI :
10.1109/ROCS.2005.201563
Filename :
1563947
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2846187
