Title :
Reliability investigation of metal-semiconductor diodes in an E/D pHEMT process
Author :
Somisetty, Shivarajiv ; Ersland, Peter ; Yang, Xinxing
Keywords :
Aging; Circuit testing; Current density; FETs; Ohmic contacts; PHEMTs; Process control; Schottky diodes; Semiconductor diodes; Voltage;
Conference_Titel :
ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
Print_ISBN :
0-7908-0106-X
DOI :
10.1109/ROCS.2005.201564
