Title :
A Ku-band integrated receiver
Author_Institution :
Texas Instruments, Inc., Dallas, TX, USA
Keywords :
Circuit testing; Equations; Gunn devices; Impedance; Microstrip; Oscillators; Radio frequency; Schottky barriers; Schottky diodes; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1968 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1968.1154619
