• DocumentCode
    2846525
  • Title

    Three-port scattering parameters for microwave transistor measurement

  • Author

    Satoda, Y. ; Bodway, G.

  • Author_Institution
    Hewlett-Packard Co., Palo Alto, CA, USA
  • Volume
    XI
  • fYear
    1968
  • fDate
    14-16 Feb. 1968
  • Firstpage
    128
  • Lastpage
    129
  • Keywords
    Calibration; Fixtures; Frequency; Microwave devices; Microwave measurements; Microwave transistors; Scattering parameters; Semiconductor device measurement; Thin film transistors; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1968 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1968.1154633
  • Filename
    1154633
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2846525