Title :
Three-port scattering parameters for microwave transistor measurement
Author :
Satoda, Y. ; Bodway, G.
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
Keywords :
Calibration; Fixtures; Frequency; Microwave devices; Microwave measurements; Microwave transistors; Scattering parameters; Semiconductor device measurement; Thin film transistors; Wavelength measurement;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1968 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1968.1154633
