Title :
An 80-NS plated-wire store for a time compression multiplex transmission system
Author :
Heightley, J. ; Perneski, A.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
Keywords :
Circuit testing; Current control; Diodes; Driver circuits; Logic circuits; Noise figure; Solid state circuits; Switches; Switching circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1968 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1968.1154640
