Title :
Transient application of sub-cell wire and slot models to unstructured, tetrahedral-element meshes
Author :
Riley, D.J. ; Turner, D. ; Kotulskl, J.D.
Author_Institution :
Dept. of Radiation & Electromagn. Anal., Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
In principle, small features in electromagnetic simulations can be modeled by arbitrary unstructured meshes. In practice, however, the increase in cell count and the reduction in the time step in an explicit algorithm can be prohibitive. Therefore, the ability to model small features using sub-cell models is important. Early work in sub-cell models for thin wires and slots was restricted to simple rectangular-cell grids. Extensions to tetrahedral-element grids are developed in this paper. The algorithms have been implemented into the 3D, transient electromagnetic field solver, VOLMAX. VOLMAX is a fully explicit solver that operates simultaneously on unstructured grids (finite-volume time domain, FVTD) and structured grids (finite-difference time domain, FDTD). VOLMAX is based on an interleaved primary- and dual-grid formulation.
Keywords :
electromagnetic compatibility; electromagnetic fields; electromagnetic interference; finite difference time-domain analysis; finite volume methods; transient analysis; 3D transient electromagnetic field solver; EMC; EMI; FDTD; FVTD; VOLMAX; dual-grid formulation; electromagnetic simulations; explicit algorithm; finite-difference time domain; finite-volume time domain; primary-grid formulation; rectangular-cell grids; slot model; slots; small features modeling; structured grids; sub-cell wire models; tetrahedral-element grids; tetrahedral-element meshes; thin wires; time step reduction; transient application; unstructured meshes; Electromagnetic analysis; Electromagnetic radiation; Electromagnetic transients; Finite difference methods; Internet; Laboratories; Telephony; Time domain analysis; Voltage; Wire;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-4478-2
DOI :
10.1109/APS.1998.699209