DocumentCode

2846884

Title

Characterization of ion-implanted avalanche diode oscillators

Author

Ying, Rendong ; Mankarious, R. ; English, D. ; Bower, R. ; Coerver, L.

Author_Institution

Huges Research Laboratories, Newport Beach, CA, USA

Volume

XI

fYear

1968

fDate

14-16 Feb. 1968

Firstpage

152

Lastpage

153

Keywords

Annealing; Diodes; Ion implantation; Low-frequency noise; Noise measurement; Oscillators; P-n junctions; Passivation; Silicon; Temperature measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1968 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1968.1154655

Filename

1154655