A study of GEM foils produced at Tech-Etch

Author

Azmoun, B. ; Caccavano, A. ; Crary, D. ; Herstoff, J. ; Kearney, K. ; Keeler, G. ; Majka, R. ; Saini, G. ; Sinsheimer, J. ; Simon, F. ; Smirnov, N. ; Surrow, B. ; Woody, C.

Author_Institution

Brookhaven Nat. Lab., Upton

Volume

6

fYear

2007

fDate

Oct. 26 2007-Nov. 3 2007

Firstpage

4634

Lastpage

4639

Abstract

Tech-Etch is a manufacturing company that produces numerous types of flexible circuits and precision photo- etched parts for industrial use. They have developed the capability for producing GEM foils which can be used in a variety of research or commercial applications. We have studied a number of GEM foils produced at Tech-Etch and compared their properties and performance to GEM foils produced at CERN and by other manufacturers. Results will be reported on their gain characteristics, gain stability and uniformity, and rate dependence compared to other foils, and on their performance as actual tracking detectors in a test beam environment.

Keywords

electron multiplier detectors; foils; particle tracks; position sensitive particle detectors; CERN; GEM foils; gain stability; gas electron multipliers; photo-etched parts; tech-etch foils; tracking detectors; Detectors; Etching; Flexible manufacturing systems; Flexible printed circuits; Geometry; Manufacturing industries; Nuclear physics; Performance gain; Production; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE

Conference_Location

Honolulu, HI

ISSN

1095-7863

Print_ISBN

978-1-4244-0922-8

Electronic_ISBN

1095-7863

Type

conf

DOI

10.1109/NSSMIC.2007.4437142

Filename

4437142