DocumentCode :
2847071
Title :
Applications of an envelope simulator
Author :
Howard, A.
Author_Institution :
Application Dev. Group, Hewlett-Packard Co., Santa Rosa, CA, USA
fYear :
1998
fDate :
3-4 Dec. 1998
Firstpage :
39
Lastpage :
54
Abstract :
There are many applications of the Circuit Envelope simulator. Primarily it is used for efficiently simulating non-steady-state, digitally-modulated RF signals and transient RF signals that are found in many communications circuits and systems. Amplifier adjacent-channel power ratio, error vector magnitude, power added efficiency, frequency or phase versus time, etc. can be simulated. Transient responses of phase locked loops and automatic gain control loops can also be simulated. IQ modulators can be simulated efficiently with baseband modulation signals or sine wave inputs. The performance of receivers with modulated input signals can be simulated as well. Designers are no longer forced to characterize their circuits with unmodulated sine waves. Now, performance can be simulated with the digitally-modulated signals that the circuits will see in operation. Here is a list of typical applications: amplifier adjacent-channel power ratio (ACPR), error vector magnitude (EVM) and power-added efficiency (PAE) with modulated signals; phase locked loop (PLL) simulations: frequency-versus-time transient responses, reference oscillator feedthrough and time-domain noise simulation; I-Q modulator simulations: ACPR, EVM, baseband-to-RF signal mapping, intermodulation distortion; receiver simulation with modulated signals and interfering tones; AGC (automatic gain control) simulation.
Keywords :
UHF power amplifiers; automatic gain control; circuit simulation; intermodulation distortion; modulators; phase locked loops; time-domain analysis; transient analysis; AGC; Circuit Envelope simulator; I-Q modulator simulations; IQ modulators; PLL simulations; UHF power amplifiers; adjacent-channel power ratio; amplifier adjacent-channel power ratio; automatic gain control loops; baseband modulation signals; baseband-to-RF signal mapping; communications circuits; digitally-modulated RF signals; digitally-modulated signals; envelope simulator; error vector magnitude; interfering tones; intermodulation distortion; modulated signals; power added efficiency; power-added efficiency; receiver simulation; reference oscillator feedthrough; sine wave inputs; time-domain noise simulation; transient RF signals; transient responses; Baseband; Circuit simulation; Circuits and systems; Error correction; Frequency; Gain control; Phase locked loops; Phase modulation; Power amplifiers; Radiofrequency amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest, 1998. Computer-Aided Design and Test for High-Speed Electronics. 52nd
Conference_Location :
Rohnert Park, CA, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1998.768623
Filename :
768623
Link To Document :
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