Title :
Automated characterization of ceramic multilayer capacitors
Author :
Benabe, E. ; Skowronski, K. ; Weller, T. ; Gordon, H. ; Warder, P.
Author_Institution :
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
Abstract :
This paper describes an automated test configuration that is used for rapid characterization of the equivalent series resistance (ESR) of ceramic multilayer capacitors. The primary components in this system are a coaxial resonant line, an HP 8753D vector network analyzer, and a personal computer. Sample measurements are provided for several 1206 style capacitors, and the trends in ESR versus the internal capacitor architecture are presented.
Keywords :
UHF measurement; automatic test equipment; automatic testing; ceramic capacitors; electric resistance measurement; electron device testing; 1206 style capacitors; HP 8753D VNA; automated characterization; ceramic multilayer capacitors; coaxial resonant line; equivalent series resistance; personal computer; vector network analyzer; Automatic testing; Capacitors; Ceramics; Coaxial components; Electrical resistance measurement; Electrodes; Instruments; Measurement techniques; Nonhomogeneous media; Paramagnetic resonance;
Conference_Titel :
ARFTG Conference Digest, 1998. Computer-Aided Design and Test for High-Speed Electronics. 52nd
Conference_Location :
Rohnert Park, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1998.768629
