DocumentCode :
2847238
Title :
Study of RF flip-chip assembly with underfill epoxy
Author :
Zhang, Wenge ; Su, Bingzhi ; Feng, Zhiping ; Gupta, K.C. ; Lee, Y.C.
Author_Institution :
Colorado Univ., Boulder, CO, USA
fYear :
1998
fDate :
15-17 Apr 1998
Firstpage :
53
Lastpage :
57
Abstract :
Flip-chip assembly technology is becoming more and more important to radio frequency (RF) MCM with the following advantages: automated assembly, compact size, low cost, low crosstalk, and low insertion loss. However, flip-chip assembly also demands careful evaluation of solder joint reliability. For an assembly with a large MMIC chip or with a polymer substrate, underfill epoxy should be used to enhance the solder joint reliability. For a GaAs-on-Duraid flip-chip assembly with a chip size of 1.38 mm×4.7 mm, fatigue life could be increased from 1,300 to 11,000 cycles by the use of epoxy. Epoxy enhances solder reliability; however, it may affect electrical performance. Experimental studies have been conducted to measure the additional insertion loss resulting from the underfill epoxy. The additional loss is less than 1 dB, and it is acceptable for many RF applications
Keywords :
III-V semiconductors; MMIC; crosstalk; fatigue; flip-chip devices; gallium arsenide; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; multichip modules; polymer films; soldering; 1 dB; 1.38 mm; 4.7 mm; GaAs; GaAs-on-Duraid flip-chip assembly; MMIC chip; RF MCM; RF flip-chip assembly; assembly cost; automated assembly; chip size; crosstalk; electrical performance; fatigue life; flip-chip assembly; flip-chip assembly technology; insertion loss; polymer substrate; radio frequency MCM; solder joint reliability; underfill epoxy; Assembly; Costs; Crosstalk; Fatigue; Insertion loss; Loss measurement; MMICs; Polymers; Radio frequency; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multichip Modules and High Density Packaging, 1998. Proceedings. 1998 International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-4850-8
Type :
conf
DOI :
10.1109/ICMCM.1998.670754
Filename :
670754
Link To Document :
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