DocumentCode
2847522
Title
An In-rush Current Suppression Technique for the Solid-State Transfer Switch System
Author
Cheng, Po-Tai ; Chen, Yu-Hsing
Author_Institution
Nat. Tsing Hua Univ., Hsin-Chu
fYear
2007
fDate
2-5 April 2007
Firstpage
1698
Lastpage
1705
Abstract
More and more utility companies provide dual power feeders as a premier service of high power quality and reliability. To take advantage of this, the solid state transfer switch (STS) is adopted to protect the sensitive load against the voltage sag. However, the fast transfer process may cause in-rush current on the load-side transformer due to the resulting DC offset in its magnetic flux as the load-transfer is completed. The in-rush current can reach 8~30 p.u. and it may trigger the over-current protections on the power feeder. This paper develops a flux estimation scheme and a thyristor gating logic based on the impulse commutation bridge STS (ICBSTS) to minimize the DC offset on the magnetic flux. By sensing the line voltages of both feeders, the flux estimator can predict the peak transient flux linkage at the moment of load-transfer and evaluate a suitable timing for the transfer to minimize the inrush current. Laboratory test results are presented to validate the performance of the proposed system.
Keywords
commutation; magnetic flux; power supply quality; thyristor applications; DC offset; both feeders; flux estimation scheme; impulse commutation bridge STS; in-rush current suppression technique; load-side transformer; load-transfer moment; magnetic flux; over-current protections; peak transient flux linkage; power feeder; solid-state transfer switch system; thyristor gating logic; voltage sag; Logic; Magnetic flux; Power quality; Power system protection; Power system reliability; Sociotechnical systems; Solid state circuits; Switches; Thyristors; Voltage fluctuations; impulse commutation bridge STS; in-rush current; solid-state transfer switch; transient flux linkage; voltage sag;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Conversion Conference - Nagoya, 2007. PCC '07
Conference_Location
Nagoya
Print_ISBN
1-4244-0844-X
Electronic_ISBN
1-4244-0844-X
Type
conf
DOI
10.1109/PCCON.2007.373191
Filename
4239381
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