• DocumentCode
    284753
  • Title

    Relations between fault tolerance and internal representations for multi-layer perceptrons

  • Author

    Emmerson, M.D. ; Damper, R.I.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • Volume
    2
  • fYear
    1992
  • fDate
    23-26 Mar 1992
  • Firstpage
    281
  • Abstract
    Fault tolerance is often mentioned as an important, intrinsic property of neural networks but it has not often been the subject of directed study. Such fault tolerance as does exist must depend strongly upon the exact nature of the internal representations captured during training, and the way these are distributed across the network. A representative pattern-recognition task is used to assess the fault tolerance of feedforward neural nets as a function of hidden-layer size. Damage resistance is found to increase with the number of hidden neurons, although this finding is sensitive to the exact performance metric employed. The technique of augmentation, which can increase the fault tolerance of a net of given size, is described. To understand the relations between the obtained measures of fault tolerance and the nets´ internal representations, a number of analyses are used. These techniques have more usually been used to simplify network structure by identifying and removing redundancies, but they are equally applicable to the study of fault tolerance
  • Keywords
    feedforward neural nets; pattern recognition; augmentation; damage resistance; fault tolerance; feedforward neural nets; hidden neurons; hidden-layer size; internal representations; multi-layer perceptrons; pattern-recognition; Computer science; Electrical resistance measurement; Fault diagnosis; Fault tolerance; Feedforward neural networks; Multilayer perceptrons; Neural networks; Neurons; Redundancy; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech, and Signal Processing, 1992. ICASSP-92., 1992 IEEE International Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1520-6149
  • Print_ISBN
    0-7803-0532-9
  • Type

    conf

  • DOI
    10.1109/ICASSP.1992.226065
  • Filename
    226065