Title : 
A process-theoretic approach to supervisory control theory
         
        
            Author : 
Baeten, J.C.M. ; van Beek, D.A. ; Luttik, B. ; Markovski, J. ; Rooda, J.E.
         
        
            Author_Institution : 
Eindhoven Univ. of Technol., Eindhoven, Netherlands
         
        
        
            fDate : 
June 29 2011-July 1 2011
         
        
        
        
            Abstract : 
We revisit the central notion of controllability in supervisory control theory from process-theoretic perspective. To this end, we investigate partial bisimulation preorder, a behavioral preorder that is coarser than bisimulation equivalence and finer than simulation preorder. It is parameterized by a subset of the set of actions that need to be bisimulated, whereas the actions outside this set need only to be simulated. This preorder proves a viable means to define controllability in a nondeterministic setting as a refinement relation on processes. The new approach provides for a generalized characterization of controllability of nondeterministic discrete-event systems. We characterize the existence of a deterministic supervisor and compare our approach to existing ones in the literature. It helped identify the coarsest minimization procedure for nondeterministic plants that respects controllability. At the end, we define the notion of a maximally permissive supervisor, nonblocking property, and partial observability in our setting.
         
        
            Keywords : 
controllability; discrete event systems; minimisation; observability; bisimulation equivalence; coarsest minimization procedure; controllability notion; deterministic supervisor; maximally permissive supervisor notion; nonblocking property notion; nondeterministic discrete-event system; partial bisimulation preorder; partial observability notion; process-theoretic approach; simulation preorder; supervisory control theory; Automata; Controllability; Observability; Process control; Semantics; Supervisory control; Synchronization;
         
        
        
        
            Conference_Titel : 
American Control Conference (ACC), 2011
         
        
            Conference_Location : 
San Francisco, CA
         
        
        
            Print_ISBN : 
978-1-4577-0080-4
         
        
        
            DOI : 
10.1109/ACC.2011.5990831