Title : 
Contact resistance on diffused resistors
         
        
        
            Author_Institution : 
IBM Labs., Boeblingen, Germany
         
        
        
        
        
        
        
            Abstract : 
The electrical behavior of contacts on diffused resistors can be explained by an equivalent transmission line. What contributes to the contact resistance and how the contacts can be optimized will be discussed in this paper.
         
        
            Keywords : 
Circuits; Conductivity; Contact resistance; Electric resistance; Electrical resistance measurement; Equations; Length measurement; Proximity effect; Resistors; Surface resistance;
         
        
        
        
            Conference_Titel : 
Solid-State Circuits Conference. Digest of Technical Papers. 1969 IEEE Internationa
         
        
            Conference_Location : 
Philadelphia, PA, USA
         
        
        
            DOI : 
10.1109/ISSCC.1969.1154702