Title :
Diagnosis of single gate failures in combinational circuits
Author :
Hornbuckle, G. ; Spann, R.
Author_Institution :
MIT Lincoln Lab., Lexington, Mass., USA
Abstract :
A method for diagnosing arbitrary single-gate failures in combinational logic circuits will be presented. The procedure will locate the faulty gate and describe its failure which may be any detectable transformation of the correct gate function.
Keywords :
Anodes; Circuit faults; Circuit testing; Combinational circuits; Fault diagnosis; Fault location; Joining processes; Labeling; Laboratories; Silicon compounds;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1969 IEEE Internationa
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1969.1154720
