DocumentCode :
2847938
Title :
Wide band impedance measurement by fourier transformation of network pulse response
Author :
Farber, Alex ; Ho, Chih-Chun
Author_Institution :
IBM Corp., Yorktown Heights, N.Y., USA
Volume :
XII
fYear :
1969
fDate :
19-21 Feb. 1969
Firstpage :
170
Lastpage :
171
Abstract :
The measurement of driving point and transfer impedances over a wide spectrum rapidly and accurately will be discussed in this paper. A computer transforms the pulse response into the frequency response, and a sampling oscilloscope provides the time transformation needed for data acquisition.
Keywords :
Frequency domain analysis; Frequency measurement; Impedance measurement; Oscilloscopes; Pulse generation; Pulse measurements; Sampling methods; Time measurement; Voltage; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1969 IEEE Internationa
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1969.1154724
Filename :
1154724
Link To Document :
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