• DocumentCode
    2848192
  • Title

    Fingerprint enhancement using Hierarchical Markov Random Fields

  • Author

    Rama, Reddy K. N. V. ; Namboodiri, Anoop M.

  • Author_Institution
    HIT Hyderabad, Hyderabad, India
  • fYear
    2011
  • fDate
    11-13 Oct. 2011
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    We propose a novel approach to enhance the finger print image and extract features such as directional fields, minutiae and singular points reliably using a Hierarchical Markov Random Field Model. Unlike traditional finger print enhancement techniques, we use previously learned prior patterns from a set of clean fingerprints to restore a noisy one. We are able to recover the ridge and valley structure from degraded and noisy fingerprint images by formulating it as a hierarchical interconnected MRF that processes the information at multiple resolutions. The top layer incorporates the compatibility between an observed degraded fingerprint patch and prior training patterns in addition to ridge continuity across neighboring patches. A second layer accounts for spatial smoothness of the orientation field and its discontinuity at the singularities. Further layers could be used for incorporating higher level priors such as the class of the fingerprint. The strength of the pro posed approach lies in its flexibility to model possible variations in fingerprint images as patches and from its ability to incorporate contextual information at various resolutions. Experimental results (both quantitative and qualitative) clearly demonstrate the effectiveness of this approach.
  • Keywords
    Markov processes; feature extraction; fingerprint identification; image enhancement; feature extraction; field orientation; finger print image; fingerprint enhancement; fingerprint images; fingerprint patch; hierarchical Markov random fields; spatial smoothness; Markov processes; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biometrics (IJCB), 2011 International Joint Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4577-1358-3
  • Electronic_ISBN
    978-1-4577-1357-6
  • Type

    conf

  • DOI
    10.1109/IJCB.2011.6117540
  • Filename
    6117540