DocumentCode :
2848372
Title :
Investigation of the small pixel effect in CdZnTe detectors
Author :
Wilson, Matthew D. ; Seller, Paul ; Veale, Matthew C. ; Sellin, Paul J.
Author_Institution :
Rutherford Appleton Lab., Didcot
Volume :
2
fYear :
2007
fDate :
Oct. 26 2007-Nov. 3 2007
Firstpage :
1255
Lastpage :
1259
Abstract :
The signal shapes produced by alpha and X-ray radiation in 2 mm thick CdZnTe detectors have been measured. The signals produced in a single large pad detector and a 300 mum pixilated detector have been compared. The influence of the small pixel effect and it´s variation with detector bias is visible. Synopsys Sentaurus TCAD is used to simulate the charge carrier motion in the detectors and is compared against the measured signals. A description of how the simulations will aid detector design with optimal pixel size, inter-pixel spacing and bias voltage is included.
Keywords :
X-ray detection; gamma-ray detection; high energy physics instrumentation computing; nuclear electronics; semiconductor counters; technology CAD (electronics); CdZnTe detectors; Synopsys Sentaurus TCAD; X-ray radiation; alpha radiation; bias voltage; charge carrier motion; optimal pixel size; signal shapes; size 2 mm; small pixel effect; Charge carriers; Charge measurement; Current measurement; Motion detection; Radiation detectors; Shape measurement; Signal detection; Thickness measurement; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
ISSN :
1095-7863
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2007.4437231
Filename :
4437231
Link To Document :
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