DocumentCode :
2848434
Title :
Bayesian prediction and adaptive sampling algorithms for mobile sensor networks
Author :
Yunfei Xu ; Jongeun Choi ; Dass, S. ; Maiti, T.
Author_Institution :
Dept. of Mech. Eng., Michigan State Univ., East Lansing, MI, USA
fYear :
2011
fDate :
June 29 2011-July 1 2011
Firstpage :
4195
Lastpage :
4200
Abstract :
In this paper, we formulate a full Bayesian approach for spatio-temporal Gaussian process regression under practical conditions such as measurement noise and unknown hyperparmeters (particularly, the bandwidths). Thus, multi factorial effects of observations, measurement noise and prior distributions of hyperparameters are all correctly incorporated in the computed predictive distribution. Using discrete prior probabilities and compactly supported kernels, we provide a way to design sequential Bayesian prediction algorithms that can be computed (without using the Gibbs sampler) in constant time as the number of observations increases. Both centralized and distributed sequential Bayesian prediction algorithms have been proposed for mobile sensor networks. An adaptive sampling strategy for mobile sensors, using the maximum a posteriori (MAP) estimation, has been proposed to minimize the prediction error variances. Simulation results illustrate the effectiveness of the proposed algorithms.
Keywords :
Bayes methods; Gaussian processes; distributed sensors; maximum likelihood estimation; prediction theory; regression analysis; sampling methods; MAP; adaptive sampling algorithms; centralized sequential Bayesian prediction algorithm; discrete prior probabilities; distributed sequential Bayesian prediction algorithm; hyperparameter distributions; maximum a posteriori estimation; measurement noise; mobile sensor networks; prediction error variance minimization; predictive distribution; spatio-temporal Gaussian process regression; Algorithm design and analysis; Bayesian methods; Gaussian processes; Mobile communication; Mobile computing; Noise; Prediction algorithms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference (ACC), 2011
Conference_Location :
San Francisco, CA
ISSN :
0743-1619
Print_ISBN :
978-1-4577-0080-4
Type :
conf
DOI :
10.1109/ACC.2011.5990887
Filename :
5990887
Link To Document :
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