• DocumentCode
    2848472
  • Title

    Automation of Synchronous Bias Transmission Line Pulsing System

  • Author

    Chang, Bor-Wei ; Hsu, Hsin-Chyh ; Ker, Ming-Dou

  • Author_Institution
    Ind. Technol. Res. Inst., Hsinchu
  • fYear
    2007
  • fDate
    25-27 April 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Synchronous bias transmission line pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line pulse. It´s a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It´s important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in LabVIEW environment to create a smart and friendly test workbench.
  • Keywords
    CMOS integrated circuits; electrostatic discharge; integrated circuit reliability; integrated circuit testing; transmission lines; virtual instrumentation; automatic SB-TLP; electrostatic discharge protection design; synchronous bias transmission line pulsing system; synchronous bias voltage; Automation; Circuit testing; Data analysis; Distributed parameter circuits; Electrostatic discharge; Electrostatic measurements; Protection; System testing; Transmission lines; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2007. VLSI-DAT 2007. International Symposium on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    1-4244-0583-1
  • Electronic_ISBN
    1-4244-0583-1
  • Type

    conf

  • DOI
    10.1109/VDAT.2007.373254
  • Filename
    4239446