Title :
The impact of technology on radiation-hardened integrated circuits
Author :
Spratt, J. ; Schnable, G. ; Standeven, J.
Author_Institution :
Philco-Ford Corp., Blue Bell, Pa., USA
Abstract :
The physics, process technology, and circuit design of radiation-hardened ICs will be discussed. Appropriate circuit design, plus optimum processing techniques (dielectric isolation, small geometry, controlled assembly methods, etc.) will be shown to improve low-power integrated circuits to the point where they no longer limit most systems exposed to nuclear weapons.
Keywords :
Design engineering; Electronic circuits; Integrated circuit technology; Ionization; Neutrons; Nuclear weapons; Photoconductivity; Silicon; Space technology; Transient analysis;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1969 IEEE Internationa
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1969.1154772