DocumentCode :
2849116
Title :
Controller design for a closed-loop scanning tunneling microscope
Author :
Ahmad, Irfan ; Voda, Alina ; Besançon, Gildas
Author_Institution :
Dept. of Control Syst., ENSIEG-INPG, Grenoble
fYear :
2008
fDate :
23-26 Aug. 2008
Firstpage :
971
Lastpage :
976
Abstract :
This paper focuses on controller design for a closed-loop scanning tunneling microscope to deal with fast variations in sample surface. A linear approximation approach is used to deal with non-linearities. The desired performances are then achieved by a controller design based on pole placement with sensitivity function shaping using second order digital notch filters. The corresponding simulation results show better performances than those obtained with PID control techniques.
Keywords :
closed loop systems; control nonlinearities; control system synthesis; digital filters; notch filters; physical instrumentation control; pole assignment; scanning tunnelling microscopy; sensitivity analysis; PID control; closed-loop scanning tunneling microscope; control nonlinearity; controller design; linear approximation approach; robust pole placement; second order digital notch filter; sensitivity function shaping method; Automatic control; Control systems; Feedback control; Microscopy; Open loop systems; Shape control; State feedback; Three-term control; Tunneling; Voltage control; Controller design; Linear approximation; Scanning tunneling microscope; Sensitivity function shaping; Simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation Science and Engineering, 2008. CASE 2008. IEEE International Conference on
Conference_Location :
Arlington, VA
Print_ISBN :
978-1-4244-2022-3
Electronic_ISBN :
978-1-4244-2023-0
Type :
conf
DOI :
10.1109/COASE.2008.4626558
Filename :
4626558
Link To Document :
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