• DocumentCode
    2849122
  • Title

    Integrating data-based modeling and nonlinear control tools for batch process control

  • Author

    Aumi, S. ; Mhaskar, P.

  • Author_Institution
    Dept. of Chem. Eng., McMaster Univ., Hamilton, ON, Canada
  • fYear
    2011
  • fDate
    June 29 2011-July 1 2011
  • Firstpage
    2534
  • Lastpage
    2539
  • Abstract
    This work presents a data-based multi-model approach for modeling batch systems in which multiple local linear models are identified using partial least squares (PLS) regression and then combined with an appropriate weighting function that arises from fuzzy c-means clustering. The resulting data-based model is used to generate estimates of empirical reverse-time reachability regions (RTRRs) (defined as the set of states from where the data-based model can be driven inside a desired end-point neighborhood of the batch system) using an optimization based algorithm. The empirical RTRRs are used to formulate a computationally efficient predictive controller with inherent fault-tolerant characteristics. Simulation results of a fed-batch reactor subject to noise, disturbances, and uncertain parameters demonstrate that the empirical RTRR-based MPC design consistently outperforms PI control in both a fault-free and faulty environment.
  • Keywords
    batch processing (industrial); bioreactors; control system synthesis; fuzzy set theory; least squares approximations; linear systems; nonlinear control systems; optimisation; parameter estimation; predictive control; process control; reachability analysis; uncertain systems; PLS regression; RTRR-based MPC design; batch process control; data-based multimodel approach; fault tolerant characteristics; fault-free environment; fed batch reactor; fuzzy c-means clustering; multiple local linear model identification; nonlinear control tool; optimization; partial least squares regression; predictive controller; reverse-time reachability region; uncertain parameters; weighting function; Computational modeling; Data models; Databases; Ellipsoids; Mathematical model; Predictive models; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2011
  • Conference_Location
    San Francisco, CA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4577-0080-4
  • Type

    conf

  • DOI
    10.1109/ACC.2011.5990930
  • Filename
    5990930