DocumentCode
2849122
Title
Integrating data-based modeling and nonlinear control tools for batch process control
Author
Aumi, S. ; Mhaskar, P.
Author_Institution
Dept. of Chem. Eng., McMaster Univ., Hamilton, ON, Canada
fYear
2011
fDate
June 29 2011-July 1 2011
Firstpage
2534
Lastpage
2539
Abstract
This work presents a data-based multi-model approach for modeling batch systems in which multiple local linear models are identified using partial least squares (PLS) regression and then combined with an appropriate weighting function that arises from fuzzy c-means clustering. The resulting data-based model is used to generate estimates of empirical reverse-time reachability regions (RTRRs) (defined as the set of states from where the data-based model can be driven inside a desired end-point neighborhood of the batch system) using an optimization based algorithm. The empirical RTRRs are used to formulate a computationally efficient predictive controller with inherent fault-tolerant characteristics. Simulation results of a fed-batch reactor subject to noise, disturbances, and uncertain parameters demonstrate that the empirical RTRR-based MPC design consistently outperforms PI control in both a fault-free and faulty environment.
Keywords
batch processing (industrial); bioreactors; control system synthesis; fuzzy set theory; least squares approximations; linear systems; nonlinear control systems; optimisation; parameter estimation; predictive control; process control; reachability analysis; uncertain systems; PLS regression; RTRR-based MPC design; batch process control; data-based multimodel approach; fault tolerant characteristics; fault-free environment; fed batch reactor; fuzzy c-means clustering; multiple local linear model identification; nonlinear control tool; optimization; partial least squares regression; predictive controller; reverse-time reachability region; uncertain parameters; weighting function; Computational modeling; Data models; Databases; Ellipsoids; Mathematical model; Predictive models; Trajectory;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2011
Conference_Location
San Francisco, CA
ISSN
0743-1619
Print_ISBN
978-1-4577-0080-4
Type
conf
DOI
10.1109/ACC.2011.5990930
Filename
5990930
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