• DocumentCode
    2849405
  • Title

    Nano-scale leakage characterizations of the γ-APTES/ silica nanoparticles bionanocomposite

  • Author

    Hsu, Po-Yen ; Lin, Jing-Jenn ; Jhuang, Jheng-Jia ; Wu, You-Lin

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chi Nan Univ., Nantou, Taiwan
  • fYear
    2011
  • fDate
    17-18 Nov. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This work proposes the nano-scale leakage characterizations for post-UV irradiated membrane of a polydimethylsiloxane (PDMS)-treated hydrophobic fumed silica nanoparticles (NPs) and 3-aminopropyltriethoxysilane mixture (γ-APTES+NPs+UV) by conductive atomic-force-microscopy (C-AFM). We found the leakage characterizations of the γ-APTES+NPs+UV are similar to those of dielectric material. Our results show that prolonged UV illumination (120s) and 100:1 γ-APTES/silica NPs mixing ratio result in the lowest leakage current and highest breakdown voltage.
  • Keywords
    atomic force microscopy; biomolecular electronics; dielectric materials; leakage currents; nanocomposites; nanoparticles; ultraviolet spectra; γ-APTES; 3-aminopropyltriethoxysilane mixture; breakdown voltage; conductive atomic-force-microscopy; dielectric material; leakage current; mixing ratio; nanoscale leakage characterizations; post-UV irradiated membrane; silica nanoparticles bionanocomposite; Biomembranes; Biosensors; Leakage current; Lighting; Nanobioscience; Silicon compounds; 3-aminopropyltriethoxysilane; atomic-force-microscopy; leakage; polydimethylsiloxane; post-UV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
  • Conference_Location
    Tianjin
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-1998-1
  • Electronic_ISBN
    Pending
  • Type

    conf

  • DOI
    10.1109/EDSSC.2011.6117608
  • Filename
    6117608