DocumentCode :
2849413
Title :
A qualitative comparison study of analog performance of junction and junctionless poly-Si TFTs
Author :
Wang, Shih-Wei ; Lin, Jyi-Tsong ; Eng, Yi-Chuen ; Chang, Yu-Che ; Lin, Chia-Hsien ; Chen, Hsuan-Hsu ; Lin, Po-Hsieh ; Tai, Chih-Hsuan ; Pai, Ching-Yao
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
fYear :
2011
fDate :
17-18 Nov. 2011
Firstpage :
1
Lastpage :
2
Abstract :
In this work, a qualitative comparison study of analog performance of junction and junctionless poly-Si TFTs is carefully investigated. According to numerical simulations, we find out that both gm and gD of junction poly-Si TFT are higher than the junctionless poly-Si TFT at a fixed IDS. Based on the same S/D doping concentration the junctionless poly-Si TFT can have a better short-channel behavior than its counterpart. Thus, it can be proved that a junctionless poly-Si TFT is a good option for AMLCD and AMOLED Applications.
Keywords :
elemental semiconductors; silicon; thin film transistors; AMLCD application; AMOLED application; S-D doping concentration; Si; analog performance; junction polysilicon TFT; junctionless polysilicon TFT; numerical simulations; qualitative comparison study; short-channel behavior; Doping; Fabrication; Junctions; Logic gates; Performance evaluation; Thin film transistors; Analog operation; junctionless (JL) transistor; thin-film transistor (TFT);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
Conference_Location :
Tianjin
ISSN :
Pending
Print_ISBN :
978-1-4577-1998-1
Electronic_ISBN :
Pending
Type :
conf
DOI :
10.1109/EDSSC.2011.6117609
Filename :
6117609
Link To Document :
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