• DocumentCode
    2849768
  • Title

    Effect of Mg on the Microstructure and Properties of Sn-Ag-Cu Lead-free Solder

  • Author

    Sheng, Lu ; Chenggang, Wei

  • Author_Institution
    Dept. of Welding & Mater. Forming, Jiangsu Univ. of Sci. & Technol.
  • fYear
    2005
  • fDate
    2-2 Sept. 2005
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a SnAgCuMg solder alloy system was developed considering its potential as a direct substitute for Sn-Pb solder for electronic assembly. Ingots with additive 1%5 3% and 5% (wt ) Mg to an eutectic Sn-4.0Ag-0.5Cu alloy were cast by means of a resistance furnace. To reduce the oxidation tendency of magnesium during melting and casting process, a special device was employed. The melting characteristic of SnAgCuMg solders was evaluated and compared with Sn-4.0Ag-0.5Cu alloy by differential thermal analysis (DTA). The microstructure observation was carried out by means of optical microscopy (OM) and scanning electron microscopy (SEM). It showed that SnAgCu solder tends to melt at lower temperature with the addition of Mg. Without typical Ag3Sn/beta-Sn eutectic microstructure, SnAgCuMg solders present different microstructures from eutectic Sn-4.0Ag-0.5Cu. Some Sn, Ag, Mg-rich polygons were found among beta-Sn matrix of SnAgCuMg solders by energy dispersed spectrum (EDS)
  • Keywords
    copper alloys; magnesium; materials testing; optical microscopy; scanning electron microscopy; silver alloys; solders; thermal analysis; tin alloys; Mg; SnAgCu; differential thermal analysis; electronic assembly; lead-free solder; optical microscopy; scanning electron microscopy; Additives; Assembly systems; Environmentally friendly manufacturing techniques; Furnaces; Lead; Microstructure; Optical microscopy; Oxidation; Scanning electron microscopy; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2005 6th International Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    0-7803-9449-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2005.1564690
  • Filename
    1564690