Title :
Investigation of Scaling for Multi-Gate MOSFETs Using Analytical Solution of 3-D Poisson´s Equation
Author :
Wu, Yu-Sheng ; Su, Pin
Author_Institution :
Nat. Chiao Tung Univ., Hsinchu
Abstract :
Introduction Due to its better gate control, multi-gate structure is an important candidate for CMOS scaling. Dependent on the aspect ratio, FinFET and Tri-gate are two main options in the multi-gate device design. For 45nm technology, Tri-gate was suggested by [1] as a more scalable structure than FinFET. Nevertheless, the study in [2] indicated that Tri-gate transistors are not feasible when lightly doped body [3] is adopted. Whether Tri-gate is suitable for future scaling merits further examination. In this work, we investigate the scalability of multi-gate MOSFETs using the solution of 3-D Poisson´s equation.
Keywords :
CMOS integrated circuits; MOSFET; Poisson equation; scaling circuits; 3-D poisson equation; CMOS scaling; FinFET; Tri-gate; analytical solution; gate control; multigate MOSFETs; CMOS technology; Dielectric devices; Dielectrics and electrical insulation; Doping; FinFETs; High K dielectric materials; High-K gate dielectrics; MOSFETs; Poisson equations; Voltage;
Conference_Titel :
VLSI Technology, Systems and Applications, 2007. VLSI-TSA 2007. International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
1-4244-0584-X
Electronic_ISBN :
1524-766X
DOI :
10.1109/VTSA.2007.378965