DocumentCode
2849812
Title
Exploring the Logic and Developing New Classification Methods in Attribute Hierarchy Model
Author
Mao, Mengmeng ; Ding, Shuliang
Author_Institution
Coll. of Psychol., Jiang Xi Normal Univ., Nanchang, China
fYear
2009
fDate
11-13 Dec. 2009
Firstpage
1
Lastpage
4
Abstract
Two new similarity indexes are introduced to explain the logic behind the classification methods A and B with attribute hierarchy model. Several kinds of new classification methods proposed are based on variations of the similarity between the expected response pattern and the observed response pattern. The results of simulation indicate that the new methods are better than methods A and B. And with the slips increasing the advantage is especially obvious.
Keywords
pattern classification; attribute hierarchy model; classification methods; expected response pattern; observed response pattern; similarity indexes; Computational modeling; Educational institutions; Enterprise resource planning; Logic; Logistics; Pattern matching; Probability; Psychology; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence and Software Engineering, 2009. CiSE 2009. International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-4507-3
Electronic_ISBN
978-1-4244-4507-3
Type
conf
DOI
10.1109/CISE.2009.5365312
Filename
5365312
Link To Document