Title :
Design of a hysteresis lock detector for dual-loops clock and data recovery circuit
Author :
Tan, Yung Sern ; Yeo, Kiat Seng ; Boon, Chirn Chye ; Do, Manh Anh
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
In dual-loops clock and data recovery (CDR) circuit design, lock detector is crucial in controlling the switching within CDR loop. The setting of the frequency accuracy of lock detector is a tough task as large ppm will leads to a longer lock time for phase tracking loop and small ppm will leads to more switching time between the loops. A novel lock detector with hysteresis property is proposed in this paper. It provides two different ppms in both different conditions; a smaller ppm for in-lock condition and a larger ppm for out-of-lock condition. This paper also provides a detailed analysis of the proposed lock detector at different conditions. The proposed lock detector is simulated in 0.18-um technology and it consumes 1.1-mW at a 1.8V supply voltage.
Keywords :
clock and data recovery circuits; detector circuits; logic design; CDR circuit design; dual-loops clock-and-data recovery circuit; frequency accuracy; hysteresis lock detector; phase tracking loop; power 1.1 mW; size 0.18 micron; voltage 1.8 V; Clocks; Detectors; Frequency locked loops; Radiation detectors; Time frequency analysis; Tracking loops; Voltage-controlled oscillators; dual-loops clock and data recovery circuit; frequency lock detector; hysteresis property;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
Conference_Location :
Tianjin
Print_ISBN :
978-1-4577-1998-1
Electronic_ISBN :
Pending
DOI :
10.1109/EDSSC.2011.6117638