Title :
A time-domain method of measuring transistor parameters
Author_Institution :
Bell Telephone Labs., Inc., Murray Hill, NJ, USA
Abstract :
Frequency domain techniques are often tedious: questions arise regarding which frequencies to use, since parameter values, in general, vary with frequency. A different type of fitting approach will be described, enabling one to measure junction capacitances, forward transit time and forward recombination time averaged during a pulse, using only simple time domain techniques and requiring little computing time.
Keywords :
Capacitance; Circuit analysis; Differential equations; Frequency domain analysis; Integral equations; Pulse measurements; Telephony; Time domain analysis; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1970 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1970.1154858
