DocumentCode :
2850099
Title :
The analysis of the transient process in TEM-wave transmission lines on the basis of the model of the communication line piece as an equivalent with lumped parameters with account of the skin effect
Author :
Ogachkov, Igor V.
Author_Institution :
Omsk State Tech. Univ., Russia
fYear :
1998
fDate :
1998
Firstpage :
319
Lastpage :
322
Abstract :
The analysis of the signals propagation of ultrahigh frequencies and transmission of small duration pulses requires increase of the accuracy and expansion of borders of the applicability of existing models. In this paper will be spent the analysis of edges distortions of the pulsing signals, propagating in TEM-wave communication lines, on the basis of the model, in which a piece of line is replaced by a circuit with concentrated elements with account of the skin effect in conductors. The formulas for the transient response of signals, propagating in the loaded lines are received. The formulas, received by the author, supplement the existing Laplace-transformation tables and also specify the cables of determined integrals. By results of the analysis the comparative graphs of the transitive characteristic for a typical communication line with a typical parallel resistor-capacitor load are drawn
Keywords :
equivalent circuits; lumped parameter networks; skin effect; transient analysis; transmission line theory; Laplace transform; TEM wave; UHF signal propagation; lumped parameter model; parallel resistor-capacitor load; pulse transmission; skin effect; transient process; transmission line; Circuits; Conductors; Distortion; Frequency; Power system transients; Signal analysis; Signal processing; Skin effect; Transient analysis; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Instrument Engineering Proceedings, 1998. APEIE-98. Volume 1. 4th International Conference on Actual Problems of
Conference_Location :
Novosibirsk
Print_ISBN :
0-7803-4938-5
Type :
conf
DOI :
10.1109/APEIE.1998.768977
Filename :
768977
Link To Document :
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