DocumentCode :
2850182
Title :
Size-controlled decananometer InGaAs quantum wires grown by selective MBE on InP
Author :
Muranaka, Tsutomu ; Okada, Hiroshi ; Hanada, Yuuki ; Fujikura, Hajime ; Hasegawa, Hideki
Author_Institution :
Res. Center for Interface Quantum Electron., Hokkaido Univ., Sapporo, Japan
fYear :
1998
fDate :
11-15 May 1998
Firstpage :
817
Lastpage :
820
Abstract :
The purpose of the present paper is to investigate the controllability of the wire size for the newly developed selective molecular beam epitaxial (MBE) growth process of the InGaAs ridge quantum wires formed on mesa-patterned InP substrates. For this, detailed scanning electron microscope (SEM), photoluminescence (PL) and magnetoresistance observations were made. All of these measurements revealed that the InGaAs ridge quantum wires having widths in a decananometer range can be successfully formed in a size-controlled fashion. These wires showed good PL and transport properties. Nonlinear Landau plots of Shubnikov-de Haas (SdH) oscillations were observed in the present wires with the decananometer widths, indicating achievement of large subband spacing values, hω0, more than 10 meV
Keywords :
III-V semiconductors; Shubnikov-de Haas effect; gallium arsenide; indium compounds; magnetoresistance; molecular beam epitaxial growth; photoluminescence; scanning electron microscopy; semiconductor growth; semiconductor quantum wires; InGaAs; InGaAs ridge quantum wires; InP; Shubnikov-de Haas oscillations; controllability; large subband spacing values; magnetoresistance; nonlinear Landau plots; photoluminescence; scanning electron microscopy; selective MBE on InP; size-controlled decananometer InGaAs quantum wires; wire size; Controllability; Indium gallium arsenide; Indium phosphide; Magnetic force microscopy; Magnetoresistance; Molecular beam epitaxial growth; Photoluminescence; Scanning electron microscopy; Substrates; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1998 International Conference on
Conference_Location :
Tsukuba
ISSN :
1092-8669
Print_ISBN :
0-7803-4220-8
Type :
conf
DOI :
10.1109/ICIPRM.1998.712792
Filename :
712792
Link To Document :
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