DocumentCode :
2850372
Title :
On the design of easily testable and reconfigurable systolic arrays
Author :
Kim, Jung H.
Author_Institution :
Center for Adv. Comput. Studies, Southwestern Louisiana Univ., Lafayette, LA, USA
fYear :
1988
fDate :
25-27 May 1988
Firstpage :
505
Lastpage :
514
Abstract :
Methods to design easily testable and reconfigurable (ETAR) systolic arrays are proposed, and procedures to design linear unidirectional and bidirectional systolic arrays are given. The main feature of the proposed designs is that the processing elements in liner arrays can all be tested simultaneously, thus reducing the testing time significantly. Another feature is that the throughputs of the reconfigured linear unidirectional as well as bidirectional arrays can equal those of the fault-free linear arrays
Keywords :
cellular arrays; circuit CAD; fault tolerant computing; integrated circuit testing; ETAR systolic arrays; bidirectional systolic arrays; fault-free linear arrays; linear unidirectional systolic arrays; reconfigurable systolic arrays; testable systolic arrays; throughputs; Clocks; Costs; Degradation; Design methodology; Fault detection; Fault tolerance; System testing; Systolic arrays; Throughput; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systolic Arrays, 1988., Proceedings of the International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-8186-8860-2
Type :
conf
DOI :
10.1109/ARRAYS.1988.18087
Filename :
18087
Link To Document :
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