Study on boundary scan interconnect test of PCB based on genetic algorithm

Test generation is one key technologies of boundary scan. Test set affects test efficiency and results directly. Genetic algorithm (GA) is inducted to boundary scan test in field of DFT (design for testability) in this paper. PCB (printed circuit board) and MCM (multichip module) are taken as project objects to explore an algorithm of GA interconnect test generation. Based on the characteristic of interconnect, the fitness function and genetic operators are put forward. Through the imitation and test in practice for DEMO board developed by us, that shows the algorithm is superior to other algorithms to some extent.