Study on boundary scan interconnect test of PCB based on genetic algorithm

Author

Yuling, Shang ; Xuelong, Yan

Author_Institution

CAD Inst., Xidian Univ., Xi´´an, China

fYear

2005

fDate

30 Aug.-2 Sept. 2005

Firstpage

348

Lastpage

350

Abstract

Test generation is one key technologies of boundary scan. Test set affects test efficiency and results directly. Genetic algorithm (GA) is inducted to boundary scan test in field of DFT (design for testability) in this paper. PCB (printed circuit board) and MCM (multichip module) are taken as project objects to explore an algorithm of GA interconnect test generation. Based on the characteristic of interconnect, the fitness function and genetic operators are put forward. Through the imitation and test in practice for DEMO board developed by us, that shows the algorithm is superior to other algorithms to some extent.

Keywords

boundary scan testing; design for testability; genetic algorithms; interconnections; printed circuit testing; boundary scan interconnect test; design for testability; fitness function; genetic algorithm; genetic operators; interconnect test generation; multichip module; printed circuit board; Algorithm design and analysis; Biological cells; Circuit testing; Design for testability; Electronic equipment testing; Genetic algorithms; Genetic engineering; Integrated circuit interconnections; Printed circuits; System testing; boundary-scan; genetic algorithm;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Packaging Technology, 2005 6th International Conference on

Print_ISBN

0-7803-9449-6

Type

conf

DOI

10.1109/ICEPT.2005.1564740

Filename

1564740