Title :
Power-noise characterization of phase-locked IMPATT oscillators
Author :
Tatsuguchi, I. ; Dietrich, N. ; Swan, C.
Author_Institution :
Bell Laboratories, Allentown, PA, USA
Abstract :
The interdependence of FM noise and output power has been investigated for phase-locked IMPATT oscillators. Power-noise characterization which allows comparison of diodes, as well as the selection of favorable operating conditions, will be presented.
Keywords :
Current supplies; Diodes; Electrical resistance measurement; Frequency measurement; Microwave oscillators; Noise measurement; Phase noise; Power generation; Power measurement; Signal to noise ratio;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1971 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1971.1154918
