Title :
An Investigation on Capacitive Coupling in RAM Address Decoders
Author :
Hamdioui, Said ; AL-Ars, Zaid ; Gaydadjiev, Georgi N. ; Van de Goor, Ad J.
Author_Institution :
Delft Univ. of Technol., Delft
Abstract :
In this paper, a complete analysis of address decoder delay faults due to capacitive coupling between address lines is presented. Detection conditions are used to explore the space of possible tests in order to detect these faults, resulting in new tests. The best test is proposed to be combined with other tests (while using the freedom of march tests) to target other faults.
Keywords :
codecs; fault diagnosis; logic testing; random-access storage; storage allocation; RAM address decoders; address decoder delay faults; capacitive coupling; fault detection conditions; Bridge circuits; Circuit faults; Crosstalk; Decoding; Delay; Fault detection; Random access memory; Space exploration; Space technology; Testing; address decoder faults; capacitive coupling; delay faults; memory testing;
Conference_Titel :
Design and Test Workshop, 2007. IDT 2007. 2nd International
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-1824-4
Electronic_ISBN :
978-1-4244-1825-1
DOI :
10.1109/IDT.2007.4437418
