DocumentCode :
285116
Title :
Threshold non-linearity effects on weight-decay tolerance in analog neural networks
Author :
Mundie, D.B. ; Massengill, L.W.
Author_Institution :
Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
Volume :
2
fYear :
1992
fDate :
7-11 Jun 1992
Firstpage :
583
Abstract :
It is shown that one of the VLSI design issues that must be considered is the temperature of the activation function used in the neurons. Though low temperature activation functions (such as simple comparators) are efficient to implement in hardware and use minimal power, the overall accuracy of the network may suffer. Nonstandard training schemes that move the synaptic sums away from the transition region or higher-temperature activation functions must be used. The influence of activation temperature on artificial neural network (ANN) robustness when experiencing weight decay is presented. A simulator design which is specifically tailored to studying analog VLSI ANN implementations is presented. Data resulting from training a typical backpropagation network using various temperature activation functions and tracking the network´s sensitivity to weight decay are presented
Keywords :
VLSI; neural chips; threshold logic; transfer functions; VLSI design issues; activation function; activation functions; activation temperature; analog VLSI ANN; artificial neural network; backpropagation network; low temperature activation functions; robustness; simulator design; synaptic sums; threshold nonlinearity; weight decay; weight-decay tolerance; Artificial neural networks; Energy consumption; Equations; Feedforward systems; Intelligent networks; Neural networks; Robustness; Temperature sensors; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 1992. IJCNN., International Joint Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0559-0
Type :
conf
DOI :
10.1109/IJCNN.1992.226925
Filename :
226925
Link To Document :
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