Title :
Proxels for Reliability Assessment of Future Nano-Architectures
Author :
Lazarova-Molnar, Sanja ; Beiu, Valeriu ; Ibrahim, Walid
Author_Institution :
UAE Univ., Al Ain
Abstract :
As devices are scaled towards the infinitesimal, the occurrences of defects and failures will certainly increase. This is a statement that has been repeated on numerous occasions recently. Therefore, accurate evaluation of reliability should be considered-besides area, power, and delay-as one additional design parameter of future nano-circuits. The goal of this paper is to evaluate the applicability (for this particular task) of the recently developed proxel-based method. The paper will include a background on the proxel-based method, its customization for the particular task at hand, as well as experimental results regarding its applicability towards reliability evaluation of nano-circuits.
Keywords :
integrated circuit modelling; integrated circuit reliability; nanoelectronics; future nano-architectures; nano-circuit reliability; proxels; reliability assessment; Added delay; Automotive engineering; Discrete event simulation; Educational institutions; Exponential distribution; Information technology; Intelligent systems; Nanoscale devices; Power system reliability; Transient analysis; Nano-circuits; non-exponential distributions; proxels; reliability; simulation;
Conference_Titel :
Design and Test Workshop, 2007. IDT 2007. 2nd International
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-1824-4
Electronic_ISBN :
978-1-4244-1825-1
DOI :
10.1109/IDT.2007.4437435
