Title :
Recovery from Transition Errors in Sequential Circuits
Author :
Das, Ramashis ; Hayes, John P.
Author_Institution :
Univ. of Michigan, Ann Arbor
Abstract :
We consider the impact of one-cycle transient faults on the state behavior of sequential circuits. The resultant errors are broadly classified into non-critical output errors and critical (state) transition errors. We also study the time required for recovery (self-healing) from transition errors under random input sequences, and present some experimental data for benchmark circuits.
Keywords :
fault diagnosis; logic testing; sequential circuits; transient analysis; critical transition errors; noncritical output errors; one-cycle transient faults; sequential circuits; Circuit faults; Clocks; Computer architecture; Computer errors; Error correction; Frequency; Integrated circuit reliability; Laboratories; Sequential circuits; Transient analysis; Transient faults; error recovery; finite-state machines; state tranistion graphs; transition errors;
Conference_Titel :
Design and Test Workshop, 2007. IDT 2007. 2nd International
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-1824-4
Electronic_ISBN :
978-1-4244-1825-1
DOI :
10.1109/IDT.2007.4437439
